ArC ONE
Stand-alone, desktop, versatile array control system. Comes with dedicated open-source cross-platform UI for all your RRAM measurement needs. Built upon 6 generations of increasingly complex instruments for characterising crossbars of emerging non-volatile memories. Includes current cut-off and I-V curve tracing capability.
ArC ONE Control Software: 1.5.2 or 2.0.0-rc3
Latest Firmware: 9.5
At a glance
ArC ONE is an ideal measurement instrument for working with crossbars of emerging non-volatile memory technologies. These include resistive memory, or memristors (RRAM), phase-change memory (PC-RAM), spin-transfer-torque magnetic memory (STT-MRAM), and others. A powerful hardware base coupled with an intuitive user interface that provides complete freedom for characterising single, or arrays of devices either directly on wafer or in packaged samples.
Full Description
ArC ONE contains the full measurement capability for comprehensive resistive memory characterisation. An elegant, straightforward user interface makes this instrument accessible to any researcher, from undergraduate to post-graduate level and beyond. While fitting on a desktop, adding this instrument to your range of research tools alleviates resources in a shared laboratory and provides your team with a wider range of possible paths towards your research goal.
The current generation of ArC ONE includes I-V measurement and current cut-off forming. Unlike generic parametric analysers, our bespoke systems warrant current cut-off in maximum 20us, so you know what is the input to your device at any point in time. What you see is what you get. Our single thread execution on the master u-controller on-board ensures that pulse-widths and inter-pulse timings are accurate within 10 ns. Pulse amplitudes of up to ±12V with rise/fall times of down to 30 ns and pulse widths down to 90 ns capture the full range of resistive switching requirements.
Executing a variety of read and write protocols along with implementing advanced automated test modules becomes trivial. Furthermore, complex multi-device circuit topologies can be easily tested whilst measurement data is displayed in real time.
ArC ONE Software
We thank Dr Maria Trapatseli and Dr Simone Cortese for providing sample measurements
System specifications
Reading
- Linear resistor measurement: 100 Ω to 100 MΩ with <10% error; 220Ω to 10 MΩ < 5% error @ 0.5 V;
- Linear resistor reading acquisition time: 20 ms;
- Minimum current measurement: ±1 nA (<5% error @ 0.5 V);
- Maximum current measurement: ±5 mA (<5% error @ 0.5 V);
- Non-linear resistor maximum reading acquisition time: 700us - 1 ms.
Writing
- Maximum pulse amplitude: ±12 V;
- Voltage pulse resolution (0 - ±1 V): 3 mV;
- Voltage pulse resolution (±1 V - ±12 V): 24 mV;
- Current cut-off range: 10uA - 1000uA;
- Minimum pulse width: 90 ns;
- Pulse width resolution: 10 ns;
- Maximum sourcing/sinking current: 50 mA;
- Minimum READ → WRITE interval: 120 μs;
- Minimum WRITE → READ interval: 100 μs;
Crossbar management
- Supports up to 32×32 crossbars;
- Four 2×8 headers support external connection;
- Four BNC connectors expose the active/inactive word and bit lines;
- A 68 pin PLCC slot allows packaged samples to be mounted and tested on-board;
- Active multi-port current redistribution scheme;
- V/2 and V/3 write scheme;
User Interface
- Python based - open source;
- Read Single, Read All or Read Stand Alone capabilities;
- Ability to select in between two read types;
- Color coded resistance map of DUT crossbar, updates after any operation;
- Click-to-pulse: apply single voltage pulse followed by a read operation;
- Real-time view of resistance evolution, along with the history of the pulsing operations performed;
- Pan, zoom and save publication-quality figures of the DUT history straight from the interface;
- Record the history of applied pulsing modules/single reads/single pulses in a separate history log;
- Expandable: new pulsing modules are added as separate python modules;