Shivaji University, Kolhapur

Dr T.D. Dongale from Shivaji University, Kolhapur in India tells us about his team’s experience with ArC ONE.

“We purchased the ArC ONE in 2018 with the help of a small grant received to me by my School. Initially, I was planning to purchase a Keithley source measurement unit but one of my colleagues suggested buying ArC ONE. Initially, I was sceptical to buy the ArC ONE but then I saw some of the papers Prof. Prodromakis had produced and then I finally decided to buy the instrument.”

He adds: “The learning curve of the instrument is very simple, therefore, all of my students can easily handle the instrument. We are basically working with oxide nanomaterials and some biomaterials. We also check and compare a few devices with the semiconductor parameter analyzer and the results are very satisfactory. Further, the updated control and firmware also gives us additional advantages for the electrical measurements.”

The group has had over 23 students using the ArC ONE with several prestigious placements at international universities, several students went on to Research and Development roles in industry and a few went on to Publishing houses including Springer-Nature.

Selected publications from Dr Dongale’s team

A. A. Patil, S. V. Wagh, T. D. Dongale, and D. Kim, “Electrospun 1D f-MWCNTs-TiO2 composite nanofibers for resistive memory and synaptic learning applications”, Materials Letters, 280, 128587, 2020

A. A. Patil, S. S. Khot, R. U. Amate, et al, “Bipolar-resistive switching and memristive properties of solution-processable cobalt oxide nanoparticles”. Journal of Materials Science: Materials in Electronics, 31, pp. 9695–9704, 2020

M. Y. Chougale, S. R. Patil, S. P. Shinde, et al, “Memristive switching in ionic liquid–based two-terminal discrete devices”, Ionics, 25, pp. 5575–5583, 2019

A. V. Pawar, S. S. Kanapally, K. D. Kadam, et al, “MemSens: a new detection method for heavy metals based on silver nanoparticle assisted memristive switching principle”, Journal of Materials Science: Materials in Electronics, 30, pp. 11383–11394, 2019